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METTLER TOLEDO Product Inspection Group will exhibit a range of inspection technologies at PACK EXPO East, taking place Feb. 17–19 in Philadelphia, PA. Located in Booth 900, the company will present x-ray, metal detection, checkweighing and vision inspection technologies that help processors and packers strengthen product safety, protect package quality, operate more efficiently and support regulatory compliance through reliable detection, intuitive operation and accessible data.
“Processors are facing rising costs, tighter retailer requirements and constant pressure to run faster with fewer resources,” said Tom Koshy, Sales Director at METTLER TOLEDO Product Inspection. “Our equipment portfolio gives customers practical ways to address those challenges, from flexible combination systems that streamline inspection to accessible x-ray and metal detection solutions that deliver strong performance without overextending capital budgets.”
On exhibit at PACK EXPO East will be the CV35 combination checkweigher and vision inspection system. METTLER TOLEDO’s mix-and-match portfolio allows customers to pair a wide range of inspection technologies, such as any checkweigher with any x-ray model, to meet specific application needs. Combination systems are available in multiple configurations and price points, including an all-in-one checkweigher/vision/x-ray/metal detector solution.
X12 x-ray inspection system from METTLER TOLEDOMETTLER TOLEDO
Another highlight at the show will be the M31R metal detector mounted on a simplified, economical conveyor for inspecting dry, wet and frozen products in small and medium-sized packages. Featuring METTLER TOLEDO’s SENSE™ software, the M31R delivers improved detection sensitivity with fewer false rejects, helping processors achieve reliable performance within a compact footprint.
METTLER TOLEDO’s ProdX™ data management software will be demonstrated alongside the inspection systems on exhibit. By enabling customers to remotely monitor equipment and easily collect, save, search and share data, ProdX helps support documentation requirements and provide clearer insight into line performance.
METTLER TOLEDO is also participating in PACK EXPO East’s Innovation Stage programming. JP Perreault, head of METTLER TOLEDO X-Ray Reclaim, will share a presentation on how advanced x-ray technology improves visibility of low-density contaminants and how re-inspection services can help rapidly triage affected inventory to reduce supply chain disruption. The seminar will take place Wednesday, Feb. 18, from 3 to 3:30 p.m. on Innovation Stage 1 at booth 759.
